Special session: Emerging (un-)reliability based security threats and mitigations for embedded systems

Hussam Amrouch, Jörg Henkel, Prashanth Krishnamurthy, Ramesh Karri, Naman Patel, Farshad Khorrami

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Tis paper addresses two reliability-based security threats and mitigations for embedded systems namely, aging and thermal side channels. Device aging can be used as a hardware atack vector by using voltage scaling or specially crafted instruction sequences to violate embedded processor guard bands. Short-term aging effects can be utilized to cause transient degradation of the embedded device without leaving any trace of the atack. (Termal) side channels can be used as an atack vector and as a defense. Specifically, thermal side channels are an effective and secure way to remotely monitor code execution on an embedded processor and/or to possibly leak information. Although various algorithmic means to detect anomaly are available, machine learning tools are effective for anomaly detection. We will show such utilization of deep learning networks in conjunction with thermal side channels to detect code injection/modification representing anomaly.

Original languageEnglish (US)
Title of host publicationProceedings of the 2017 International Conference on Compilers, Architectures and Synthesis for Embedded Systems Companion, CASES 2017
PublisherAssociation for Computing Machinery, Inc
ISBN (Electronic)9781450351843
DOIs
StatePublished - Oct 15 2017
Event2017 International Conference on Compilers, Architectures and Synthesis for Embedded Systems, CASES 2017 - Seoul, Korea, Republic of
Duration: Oct 15 2017Oct 20 2017

Publication series

NameProceedings of the 2017 International Conference on Compilers, Architectures and Synthesis for Embedded Systems Companion, CASES 2017

Other

Other2017 International Conference on Compilers, Architectures and Synthesis for Embedded Systems, CASES 2017
CountryKorea, Republic of
CitySeoul
Period10/15/1710/20/17

Keywords

  • Cyber-physical systems
  • Embedded systems
  • Infrared images
  • Long-term aging
  • Reliability
  • Short-term aging
  • Side channels
  • Termal measurements

ASJC Scopus subject areas

  • Software

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  • Cite this

    Amrouch, H., Henkel, J., Krishnamurthy, P., Karri, R., Patel, N., & Khorrami, F. (2017). Special session: Emerging (un-)reliability based security threats and mitigations for embedded systems. In Proceedings of the 2017 International Conference on Compilers, Architectures and Synthesis for Embedded Systems Companion, CASES 2017 [3125529] (Proceedings of the 2017 International Conference on Compilers, Architectures and Synthesis for Embedded Systems Companion, CASES 2017). Association for Computing Machinery, Inc. https://doi.org/10.1145/3125501.3125529