Special session: Machine learning for semiconductor test and reliability

Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. Van Santen, Benjamin Tan, Sheldon X.D. Tan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Engineering & Materials Science