Abstract
We discuss the use of X-ray and Raman scattering to probe structural disorder in aperiodic GaAsAlxGa1-xAs superlattices, including random and quasiperiodic examples. Evidence is found for the presence of monolayer-thick steps at the interfaces. The X-ray data appear far more sensitive to this type of disorder than the acoustic phonon spectra obtained by Raman scattering.
Original language | English (US) |
---|---|
Pages (from-to) | 371-374 |
Number of pages | 4 |
Journal | Superlattices and Microstructures |
Volume | 4 |
Issue number | 3 |
DOIs | |
State | Published - 1988 |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Electrical and Electronic Engineering