Structural fluctuations and randomness in GaAsAlxGa1-xAs superlattices

Roy Clarke, T. Moustakas, K. Bajema, D. Grier, W. Dos Passos, R. Merlin

    Research output: Contribution to journalArticle

    Abstract

    We discuss the use of X-ray and Raman scattering to probe structural disorder in aperiodic GaAsAlxGa1-xAs superlattices, including random and quasiperiodic examples. Evidence is found for the presence of monolayer-thick steps at the interfaces. The X-ray data appear far more sensitive to this type of disorder than the acoustic phonon spectra obtained by Raman scattering.

    Original languageEnglish (US)
    Pages (from-to)371-374
    Number of pages4
    JournalSuperlattices and Microstructures
    Volume4
    Issue number3
    DOIs
    StatePublished - 1988

    ASJC Scopus subject areas

    • Materials Science(all)
    • Condensed Matter Physics
    • Electrical and Electronic Engineering

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  • Cite this

    Clarke, R., Moustakas, T., Bajema, K., Grier, D., Dos Passos, W., & Merlin, R. (1988). Structural fluctuations and randomness in GaAsAlxGa1-xAs superlattices. Superlattices and Microstructures, 4(3), 371-374. https://doi.org/10.1016/0749-6036(88)90184-X