@inproceedings{8efb35436fd44ce382e44b5aabc7ec9e,
title = "Studying Aging and Soft Error Mitigation Jointly under Constrained Scenarios in Multi-Cores",
abstract = "Soft errors and aging are two substantial reliability-related problems in today's computing systems. While soft errors are transient in nature, they can lead to wrong application outputs and even application failures. However, aging has permanent effects and results in slower performance and timing errors in processors. In this paper, we will discuss different approaches how these reliability threats can be mitigated in multi-core systems for performance/power-constrained scenarios. Different research challenges and corresponding solutions will be described which jointly target the above-mentioned reliability issues while also considering additional problems like process variation and dark silicon. These solutions are implemented in different system layers and make use of an analysis of and adaptation to the application properties. Moreover, they leverage the opportunities offered by multi-core systems, for instance, to efficiently enable redundant multithreading.",
keywords = "aging, dark silicon, fault-tolerance, heterogeneous, mapping, modeling, multi-core systems, optimization, performance, process variation, Reliability, scheduling, soft errors, task management",
author = "Florian Kriebel and Semeen Rehman and Muhammad Shafique",
note = "Funding Information: ACKNOWLEDGMENT This work is supported in parts by the German Research Foundation (DFG) as part of the priority program “Dependable Embedded Systems” (SPP 1500 – http://spp1500.itec.kit.edu). Funding Information: This work is supported in parts by the German R Publisher Copyright: {\textcopyright} 2019 IEEE.; 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 ; Conference date: 01-07-2019 Through 03-07-2019",
year = "2019",
month = jul,
doi = "10.1109/IOLTS.2019.8854444",
language = "English (US)",
series = "2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "139--142",
editor = "Dimitris Gizopoulos and Dan Alexandrescu and Panagiota Papavramidou and Michail Maniatakos",
booktitle = "2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019",
}