TY - GEN
T1 - Technology-driven limits on DVFS controllability of multiple voltage-frequency island designs
T2 - 2009 46th ACM/IEEE Design Automation Conference, DAC 2009
AU - Garg, Siddharth
AU - Marculescu, Diana
AU - Marculescu, Radu
AU - Ogras, Umit
PY - 2009
Y1 - 2009
N2 - In this paper, we consider the case of network-on-chip (NoC) based multiple-processor systems-on-chip (MPSoCs) implemented using multiple voltage and frequency islands (VFIs) that rely on fine-grained dynamic voltage and frequency scaling (DVFS) for run-time control of the system power dissipation. Specifically, we present a framework to compute theoretical bounds on the performance of DVFS controllers for such systems under the impact of three important technology driven constraints: (i) reliability and temperature driven upper limits on the maximum supply voltage; (ii) inductive noise driven constraints on the maximum rate of change of voltage/frequency; and (iii) increasing manufacturing process variations. Our experimental results show that, for the benchmarks considered, any DVFS control algorithm will lose up to 87% performance, measured in terms of the number of steps required to reach a reference steady state, in the presence of maximum frequency and maximum frequency increment constraints. In addition, increasing process variations can lead to up to 60% of fabricated chips being unable to meet the specified DVFS control specifications, irrespective of the DVFS algorithm used.
AB - In this paper, we consider the case of network-on-chip (NoC) based multiple-processor systems-on-chip (MPSoCs) implemented using multiple voltage and frequency islands (VFIs) that rely on fine-grained dynamic voltage and frequency scaling (DVFS) for run-time control of the system power dissipation. Specifically, we present a framework to compute theoretical bounds on the performance of DVFS controllers for such systems under the impact of three important technology driven constraints: (i) reliability and temperature driven upper limits on the maximum supply voltage; (ii) inductive noise driven constraints on the maximum rate of change of voltage/frequency; and (iii) increasing manufacturing process variations. Our experimental results show that, for the benchmarks considered, any DVFS control algorithm will lose up to 87% performance, measured in terms of the number of steps required to reach a reference steady state, in the presence of maximum frequency and maximum frequency increment constraints. In addition, increasing process variations can lead to up to 60% of fabricated chips being unable to meet the specified DVFS control specifications, irrespective of the DVFS algorithm used.
KW - Networks-on-chip
KW - Performance bounds
KW - Power management
UR - http://www.scopus.com/inward/record.url?scp=70350702950&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=70350702950&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:70350702950
SN - 9781605584973
T3 - Proceedings - Design Automation Conference
SP - 818
EP - 821
BT - 2009 46th ACM/IEEE Design Automation Conference, DAC 2009
Y2 - 26 July 2009 through 31 July 2009
ER -