Temperature Profile Measurement and Failure Characterization of ESD Protection Devices Using Spectroscopic Photon Emission Microscopy and Raman Spectroscopy

Mahmoud Rasras, Ingrid De Wolf, Guido Groeseneken, Jian Chen, Karlheinz Bock, Herman E. Maes

Research output: Contribution to conference › Paper › peer-review

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Engineering

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Material Science