TY - GEN
T1 - Test access mechanism for chips with spare identical cores
AU - Sinanoglu, Ozgur
PY - 2012
Y1 - 2012
N2 - Scalability, power-efficiency and shorter time-to-market due to design re-use have favored the adoption of homogeneous multi-core chips with identical processing units (cores) integrated together, offering enhanced computational power. Furthermore, chips with identical cores help cope with increasing defect rates in delivering reasonable yield levels via the utilization of spare cores. In this paper, we propose a comparison-based TAM that is capable of handling spare identical cores; the proposed TAM guarantees the test of a chip through minimum bandwidth in minimum test time, while ensuring no yield loss in the presence of spare identical cores, as its design is driven by the number of spare cores on the chip. The proposed solution also enables the identification of all the good cores in usable chips, supporting models where chips are priced based on number of good cores. We also extend the proposed TAM by adding efficient diagnostic features.
AB - Scalability, power-efficiency and shorter time-to-market due to design re-use have favored the adoption of homogeneous multi-core chips with identical processing units (cores) integrated together, offering enhanced computational power. Furthermore, chips with identical cores help cope with increasing defect rates in delivering reasonable yield levels via the utilization of spare cores. In this paper, we propose a comparison-based TAM that is capable of handling spare identical cores; the proposed TAM guarantees the test of a chip through minimum bandwidth in minimum test time, while ensuring no yield loss in the presence of spare identical cores, as its design is driven by the number of spare cores on the chip. The proposed solution also enables the identification of all the good cores in usable chips, supporting models where chips are priced based on number of good cores. We also extend the proposed TAM by adding efficient diagnostic features.
UR - http://www.scopus.com/inward/record.url?scp=84869180215&partnerID=8YFLogxK
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U2 - 10.1109/IOLTS.2012.6313848
DO - 10.1109/IOLTS.2012.6313848
M3 - Conference contribution
AN - SCOPUS:84869180215
SN - 9781467320849
T3 - Proceedings of the 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012
SP - 97
EP - 102
BT - Proceedings of the 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012
T2 - 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012
Y2 - 27 June 2012 through 29 June 2012
ER -