Test access mechanism for chips with spare identical cores

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Scalability, power-efficiency and shorter time-to-market due to design re-use have favored the adoption of homogeneous multi-core chips with identical processing units (cores) integrated together, offering enhanced computational power. Furthermore, chips with identical cores help cope with increasing defect rates in delivering reasonable yield levels via the utilization of spare cores. In this paper, we propose a comparison-based TAM that is capable of handling spare identical cores; the proposed TAM guarantees the test of a chip through minimum bandwidth in minimum test time, while ensuring no yield loss in the presence of spare identical cores, as its design is driven by the number of spare cores on the chip. The proposed solution also enables the identification of all the good cores in usable chips, supporting models where chips are priced based on number of good cores. We also extend the proposed TAM by adding efficient diagnostic features.

Original languageEnglish (US)
Title of host publicationProceedings of the 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012
Pages97-102
Number of pages6
DOIs
StatePublished - 2012
Event2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012 - Sitges, Spain
Duration: Jun 27 2012Jun 29 2012

Publication series

NameProceedings of the 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012

Other

Other2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012
CountrySpain
CitySitges
Period6/27/126/29/12

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality

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