Test Power Reduction via Deterministic Alignment of Stimulus and Response Bits

Sobeeh Almukhaizim, Eman AlQuraishi, Ozgur Sinanoglu

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1-12
Journal	Journal of Low Power Electronics
Volume	7
Issue number	4
State	Published - Oct 2011

Cite this

@article{dd07e84d88964011b95e9d2b2b399c7c,

title = "Test Power Reduction via Deterministic Alignment of Stimulus and Response Bits",

author = "Sobeeh Almukhaizim and Eman AlQuraishi and Ozgur Sinanoglu",

year = "2011",

month = oct,

language = "English (US)",

volume = "7",

pages = "1--12",

journal = "Journal of Low Power Electronics",

issn = "1546-1998",

publisher = "American Scientific Publishers",

number = "4",

}