Texture characterization via joint statistics of wavelet coefficient magnitudes

Eero P. Simoncelli, Javier Portilla

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A synthesis technique capable of capturing both structural and random aspects of textures is presented. In particular, textures are characterized in terms of a set of statistical measurements on a complex analytic wavelet representation. An efficient algorithm is developed for synthesizing images. The power and flexibility of this algorithm is demonstrated through examples of texture synthesis and constrained texture synthesis.

Original languageEnglish (US)
Title of host publicationIEEE International Conference on Image Processing
PublisherIEEE Comp Soc
Pages62-66
Number of pages5
Volume1
StatePublished - 1998
EventProceedings of the 1998 International Conference on Image Processing, ICIP. Part 2 (of 3) - Chicago, IL, USA
Duration: Oct 4 1998Oct 7 1998

Other

OtherProceedings of the 1998 International Conference on Image Processing, ICIP. Part 2 (of 3)
CityChicago, IL, USA
Period10/4/9810/7/98

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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