@article{46f16ca0f6914006bf19575eb354b31f,
title = "The DZERO Level 3 data acquisition system",
abstract = "The DZERO experiment began RunII datataking operation at Fermilab in spring 2001. The physics program of the experiment requires the Level 3 data acquisition (DAQ) system system to handle average event sizes of 250 kilobytes at a rate of 1 kHz. The system routes and transfers event fragments of approximately 1-20 kilobytes from 63 VME crate sources to any of approximately 100 processing nodes. It is built upon a Cisco 6509 Ethernet switch, standard PCs, and commodity VME single board computers (SBCs). The system has been in full operation since spring 2002.",
keywords = "Computer networks, Data acquisition, Monitoring, Physics, Triggering",
author = "R. Angstadt and G. Brooijmans and D. Chapin and M. Clements and D. Cutts and A. Haas and R. Hauser and M. Johnson and A. Kulyavtsev and Mattingly, {S. E.K.} and M. Mulders and P. Padley and D. Petravick and R. Rechenmacher and S. Snyder and G. Watts",
note = "Funding Information: The authors thank the staff at Fermilab and acknowledge support from the Department of Energy and the National Science Foundation. Funding Information: Manuscript received June 9, 2003; revised January 19, 2004. This work was supported by the Department of Energy and National Science Foundation. R. Angstadt, G. Brooijmans, M. Johnson, A. Kulyavtsev, M. Mulders, D. Petravick, and R. Rechenmacher are with Fermi National Accelerator Laboratory, Batavia, IL 60510 USA. D. Chapin, M. Clements, D. Cutts, and S. E. K. Mattingly are with Brown University, Providence, RI 02912 USA (e-mail:
[email protected]). A. Haas and G. Watts are with the University of Washington, Seattle, WA 98105 USA. R. Hauser is with Michigan State University, Easst Lansing, MI 48824 USA. P. Padley is with Rice University, Houstaon, TX 77251 USA. S. Snyder is with Brookhaven National Laboratory, Upton, NY 11973 USA. Digital Object Identifier 10.1109/TNS.2004.828785",
year = "2004",
month = jun,
doi = "10.1109/TNS.2004.828785",
language = "English (US)",
volume = "51",
pages = "445--450",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "3 I",
}