The EDA challenges in the dark silicon era

Muhammad Shafique, Siddharth Garg, Jörg Henkel, Diana Marculescu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Technology scaling has resulted in smaller and faster transistors in successive technology generations. However, transistor power consumption no longer scales commensurately with integration density and, consequently, it is projected that in future technology nodes it will only be possible to simultaneously power on a fraction of cores on a multi-core chip in order to stay within the power budget. The part of the chip that is powered off is referred to as dark silicon and brings new challenges as well as opportunities for the design community, particularly in the context of the interaction of dark silicon with thermal, reliability and variability concerns. In this perspectives paper we describe these new challenges and opportunities, and provide preliminary experimental evidence in their support.

Original languageEnglish (US)
Title of host publicationDAC 2014 - 51st Design Automation Conference, Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-6
Number of pages6
ISBN (Print)9781479930173
DOIs
StatePublished - 2014
Event51st Annual Design Automation Conference, DAC 2014 - San Francisco, CA, United States
Duration: Jun 2 2014Jun 5 2014

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Other

Other51st Annual Design Automation Conference, DAC 2014
CountryUnited States
CitySan Francisco, CA
Period6/2/146/5/14

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

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  • Cite this

    Shafique, M., Garg, S., Henkel, J., & Marculescu, D. (2014). The EDA challenges in the dark silicon era. In DAC 2014 - 51st Design Automation Conference, Conference Proceedings (pp. 1-6). [2593229] (Proceedings - Design Automation Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/2593069.2593229