The electron-impact ionization of Ar and Kr revisited: a critical analysis of double-to-single ionization cross section ratio measurements using the fast-atom-beam technique

V. Tarnovsky, K. Becker

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'The electron-impact ionization of Ar and Kr revisited: a critical analysis of double-to-single ionization cross section ratio measurements using the fast-atom-beam technique'. Together they form a unique fingerprint.

Physics & Astronomy