The Impact of Artificial Intelligence on In Situ Electron Microscopy

Peter A. Crozier; Adrià Marcos Morales; Matan Leibovich; Sreyas Mohan; Piyush Haluai; Mai Tan; Joshua Vincent; Advait Gilankar; Yifan Wang; Carlos Fernandez-Granda

doi:10.1093/micmic/ozad067.1105

The Impact of Artificial Intelligence on In Situ Electron Microscopy

Peter A. Crozier, Adrià Marcos Morales, Matan Leibovich, Sreyas Mohan, Piyush Haluai, Mai Tan, Joshua Vincent, Advait Gilankar, Yifan Wang, Carlos Fernandez-Granda

Mathematics

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1595-1596
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
Issue number	1
DOIs	https://doi.org/10.1093/micmic/ozad067.1105
State	Published - Jul 22 2023

ASJC Scopus subject areas

Instrumentation

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10.1093/micmic/ozad067.1105

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title = "The Impact of Artificial Intelligence on In Situ Electron Microscopy",

author = "Crozier, {Peter A.} and Morales, {Adri{\`a} Marcos} and Matan Leibovich and Sreyas Mohan and Piyush Haluai and Mai Tan and Joshua Vincent and Advait Gilankar and Yifan Wang and Carlos Fernandez-Granda",

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AU - Crozier, Peter A.

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AU - Tan, Mai

AU - Vincent, Joshua

AU - Gilankar, Advait

AU - Wang, Yifan

AU - Fernandez-Granda, Carlos

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The Impact of Artificial Intelligence on In Situ Electron Microscopy

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