TY - GEN
T1 - The Impact of Logic Locking on Confidentiality
T2 - 26th International Symposium on Quality Electronic Design, ISQED 2025
AU - Reimann, Lennart M.
AU - Rezunov, Evgenii
AU - Germek, Dominik
AU - Collini, Luca
AU - Pilato, Christian
AU - Karri, Ramesh
AU - Leupers, Rainer
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Logic locking secures hardware designs in untrusted foundries by incorporating key-driven gates to obscure the original blueprint. While this method safeguards the integrated circuit from malicious alterations during fabrication, its influence on data confidentiality during runtime has been ignored. In this study, we employ path sensitization to formally examine the impact of logic locking on confidentiality. By applying three representative logic locking mechanisms on open-source cryptographic benchmarks, we utilize an automatic test pattern generation framework to evaluate the effect of locking on cryptographic encryption keys and sensitive data signals. Our analysis reveals that logic locking can inadvertently cause sensitive data leakage when incorrect logic locking keys are used. We show that a single malicious logic locking key can expose over 70% of an encryption key. If an adversary gains control over other inputs, the entire encryption key can be compromised. This research uncovers a significant security vulnerability in logic locking and emphasizes the need for comprehensive security assessments that extend beyond key-recovery attacks.
AB - Logic locking secures hardware designs in untrusted foundries by incorporating key-driven gates to obscure the original blueprint. While this method safeguards the integrated circuit from malicious alterations during fabrication, its influence on data confidentiality during runtime has been ignored. In this study, we employ path sensitization to formally examine the impact of logic locking on confidentiality. By applying three representative logic locking mechanisms on open-source cryptographic benchmarks, we utilize an automatic test pattern generation framework to evaluate the effect of locking on cryptographic encryption keys and sensitive data signals. Our analysis reveals that logic locking can inadvertently cause sensitive data leakage when incorrect logic locking keys are used. We show that a single malicious logic locking key can expose over 70% of an encryption key. If an adversary gains control over other inputs, the entire encryption key can be compromised. This research uncovers a significant security vulnerability in logic locking and emphasizes the need for comprehensive security assessments that extend beyond key-recovery attacks.
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U2 - 10.1109/ISQED65160.2025.11014457
DO - 10.1109/ISQED65160.2025.11014457
M3 - Conference contribution
AN - SCOPUS:105007559544
T3 - Proceedings - International Symposium on Quality Electronic Design, ISQED
BT - Proceedings of the 26th International Symposium on Quality Electronic Design, ISQED 2025
PB - IEEE Computer Society
Y2 - 23 April 2025 through 25 April 2025
ER -