Skip to main navigation
Skip to search
Skip to main content
NYU Scholars Home
Help & FAQ
Home
Profiles
Research units
Research output
Search by expertise, name or affiliation
The Use of Atomic Force Microscopy in Membrane Characterization
N. Hilal
,
D. Johnson
Engineering
Civil Engineering
Research output
:
Chapter in Book/Report/Conference proceeding
›
Chapter
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'The Use of Atomic Force Microscopy in Membrane Characterization'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Atomic Force Microscopy
100%
Membrane Characterization
100%
Membrane Surface
75%
Colloidal Particles
50%
Particle Surface
50%
Surface Topography
25%
Cell Surface
25%
Pore Size
25%
Specific Applications
25%
Liquid Environment
25%
Fouling
25%
Pore Size Distribution
25%
Operating Principle
25%
Direct Quantification
25%
Interaction Force
25%
Engineering Surfaces
25%
Membrane Separation
25%
Adhesive Force
25%
Air Environment
25%
Engineering Process
25%
Biofouling
25%
Process Engineering
25%
Surface Electrical Properties
25%
Material Science
Surface Topography
100%
Pore Size
100%
Pore Size Distribution
100%
Surface Engineering
100%
Surface Electrical Property
100%
Chemical Engineering
Process Engineering
100%
Fouling
50%
Biofouling
50%
Membranes Separation
50%
Engineering
Surface Engineering Process
25%