Thermal conductivity of thin metallic films by electron transport

Sunil Kumar, George C. Vradis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This study examines the effect of transverse thickness on the in-plane thermal conductivity of single crystal, defect-free, thin metallic films. The imposed temperature gradient is along the film and the transport of thermal energy is predominantly due to electron motion. The small size necessitates an evaluation of the Boltzmann equation of electron transport along with appropriate electron scattering boundary conditions. Simple expressions for the reduction of conductivity due to increased dominance of boundary scattering are presented and the results are compared with other simplified approaches and experimental data from the literature.

Original languageEnglish (US)
Title of host publicationHeat Transfer on the Microscale
PublisherPubl by ASME
Pages55-62
Number of pages8
ISBN (Print)0791809269
StatePublished - 1992
Event28th National Heat Transfer Conference and Exhibition - San Diego, CA, USA
Duration: Aug 9 1992Aug 12 1992

Publication series

NameAmerican Society of Mechanical Engineers, Heat Transfer Division, (Publication) HTD
Volume200
ISSN (Print)0272-5673

Other

Other28th National Heat Transfer Conference and Exhibition
CitySan Diego, CA, USA
Period8/9/928/12/92

ASJC Scopus subject areas

  • Mechanical Engineering
  • Fluid Flow and Transfer Processes

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