TY - GEN
T1 - Toggle-masking scheme for x-filtering
AU - Ramdas, Abishek
AU - Sinanoglu, Ozgur
PY - 2012
Y1 - 2012
N2 - High quality screening of chips may require aggressive solutions such as faster-than-at-speed testing, which may generate responses with high density of unknown x's. Recently, we proposed a toggle-masking approach capable of masking all the unknown x's and minimizing the over-masked known bits for clustered distribution of unknown bits. In this work, we utilize our toggle-masking framework as a foundation, and transform this solution into an x-filter that allows a certain number/distribution of x's to pass, in order to further improve the observability levels. Naturally, the modified toggle-masking scheme is to be paired with another technique, such as an x-canceling MISR, which is capable of canceling the x's in the signature via post-processing operations. We propose different flavors of the proposed x-filter to be utilized with different versions of x-canceling MISR, which may suffer from test time increase and/or observability loss with high x-density responses. By proposing an x-filter that can adjust the number/distribution of x in-flow into the MISR, a perfect control over test time and observability is delivered, offering a wide spectrum of tradeoff solutions for the designers.
AB - High quality screening of chips may require aggressive solutions such as faster-than-at-speed testing, which may generate responses with high density of unknown x's. Recently, we proposed a toggle-masking approach capable of masking all the unknown x's and minimizing the over-masked known bits for clustered distribution of unknown bits. In this work, we utilize our toggle-masking framework as a foundation, and transform this solution into an x-filter that allows a certain number/distribution of x's to pass, in order to further improve the observability levels. Naturally, the modified toggle-masking scheme is to be paired with another technique, such as an x-canceling MISR, which is capable of canceling the x's in the signature via post-processing operations. We propose different flavors of the proposed x-filter to be utilized with different versions of x-canceling MISR, which may suffer from test time increase and/or observability loss with high x-density responses. By proposing an x-filter that can adjust the number/distribution of x in-flow into the MISR, a perfect control over test time and observability is delivered, offering a wide spectrum of tradeoff solutions for the designers.
UR - http://www.scopus.com/inward/record.url?scp=84864701502&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84864701502&partnerID=8YFLogxK
U2 - 10.1109/ETS.2012.6233024
DO - 10.1109/ETS.2012.6233024
M3 - Conference contribution
AN - SCOPUS:84864701502
SN - 9781467306973
T3 - Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012
BT - Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012
T2 - 2012 17th IEEE European Test Symposium, ETS 2012
Y2 - 28 May 2012 through 1 June 2012
ER -