Toward future systems with nanoscale devices: Overcoming the reliability challenge

Wenjing Rao; Chengmo Yang; Ramesh Karri; Alex Orailoglu

doi:10.1109/MC.2011.1

Toward future systems with nanoscale devices: Overcoming the reliability challenge

Wenjing Rao, Chengmo Yang, Ramesh Karri, Alex Orailoglu

Research output: Contribution to journal › Article › peer-review

Abstract

Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

Original language	English (US)
Article number	5713301
Pages (from-to)	46-53
Number of pages	8
Journal	Computer
Volume	44
Issue number	2
DOIs	https://doi.org/10.1109/MC.2011.1
State	Published - Feb 2011

Keywords

Nanoscale systems
Reliability

ASJC Scopus subject areas

Computer Science(all)

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10.1109/MC.2011.1

Cite this

@article{433cd6ea9595450d85c971993f27fde8,

title = "Toward future systems with nanoscale devices: Overcoming the reliability challenge",

abstract = "Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.",

keywords = "Nanoscale systems, Reliability",

author = "Wenjing Rao and Chengmo Yang and Ramesh Karri and Alex Orailoglu",

year = "2011",

month = feb,

doi = "10.1109/MC.2011.1",

language = "English (US)",

volume = "44",

pages = "46--53",

journal = "ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering",

issn = "0018-9162",

publisher = "IEEE Computer Society",

number = "2",

}

TY - JOUR

T1 - Toward future systems with nanoscale devices

T2 - Overcoming the reliability challenge

AU - Rao, Wenjing

AU - Yang, Chengmo

AU - Karri, Ramesh

AU - Orailoglu, Alex

PY - 2011/2

Y1 - 2011/2

N2 - Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

AB - Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

KW - Nanoscale systems

KW - Reliability

UR - http://www.scopus.com/inward/record.url?scp=79951898918&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79951898918&partnerID=8YFLogxK

U2 - 10.1109/MC.2011.1

DO - 10.1109/MC.2011.1

M3 - Article

AN - SCOPUS:79951898918

SN - 0018-9162

VL - 44

SP - 46

EP - 53

JO - ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering

JF - ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering

IS - 2

M1 - 5713301

ER -

Toward future systems with nanoscale devices: Overcoming the reliability challenge

Abstract

Keywords

ASJC Scopus subject areas

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