Towards Provably Secure Logic Locking for Hardening Hardware Security Dissertation Summary: IEEE TTTC E.J. McCluskey Doctoral Thesis Award Competition

Muhammad Yasin, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Logic locking is a promising countermeasure against intellectual property (IP) piracy, counterfeiting, hardware Trojans, reverse engineering, and overbuilding attacks. Yet, various attacks that use a working chip as an oracle have been launched on logic locking, undermining the defense of all existing locking techniques. This paper advances the state-of-the-art in logic locking by developing new countermeasures as well as attacks. We present two logic locking techniques, SARLock and SFLL, that provide quantitative security guarantees against the SAT, removal, and approximate attacks. We validate the effectiveness of proposed techniques by taping-out two silicon chips. We also study the interplay between logic locking and VLSI test, highlighting the security vulnerabilities associated with the test of locked chips. We develop three removal attacks to evaluate the security of existing logic locking techniques.

Original languageEnglish (US)
Title of host publicationInternational Test Conference 2018, ITC 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538683828
DOIs
StatePublished - Jan 23 2019
Event49th IEEE International Test Conference, ITC 2018 - Phoenix, United States
Duration: Oct 29 2018Nov 1 2018

Publication series

NameProceedings - International Test Conference
Volume2018-October
ISSN (Print)1089-3539

Conference

Conference49th IEEE International Test Conference, ITC 2018
CountryUnited States
CityPhoenix
Period10/29/1811/1/18

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Applied Mathematics

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    Yasin, M., & Sinanoglu, O. (2019). Towards Provably Secure Logic Locking for Hardening Hardware Security Dissertation Summary: IEEE TTTC E.J. McCluskey Doctoral Thesis Award Competition. In International Test Conference 2018, ITC 2018 - Proceedings [8624809] (Proceedings - International Test Conference; Vol. 2018-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TEST.2018.8624809