Trends and Controversies

Hugo Proenca; Mark Nixon; Michele Nappi; Esam Ghaleb; Gokhan Ozbulak; Hua Gao; Hazim Kemal Ekenel; Klemen Grm; Vitomir Struc; Hailin Shi; Xiangyu Zhu; Shengcai Liao; Zhen Lei; Stan Z. Li; Weronika Gutfeter; Andrzej Pacut; Joel Brogan; Walter J. Scheirer; Ester Gonzalez-Sosa; Ruben Vera-Rodriguez; Julian Fierrez; Javier Ortega-Garcia; Daniel Riccio; Luigi De Maio

doi:10.1109/MIS.2018.033001416

Trends and Controversies

Hugo Proenca, Mark Nixon, Michele Nappi, Esam Ghaleb, Gokhan Ozbulak, Hua Gao, Hazim Kemal Ekenel, Klemen Grm, Vitomir Struc, Hailin Shi, Xiangyu Zhu, Shengcai Liao, Zhen Lei, Stan Z. Li, Weronika Gutfeter, Andrzej Pacut, Joel Brogan, Walter J. Scheirer, Ester Gonzalez-Sosa, Ruben Vera-RodriguezJulian Fierrez, Javier Ortega-Garcia, Daniel Riccio, Luigi De Maio

Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Performing covert biometric recognition in surveillance environments has been regarded as a grand challenge, considering the adversity of the conditions where recognition should be carried out (e.g., poor resolution, bad lighting, off-pose and partially occluded data). This special issue compiles a group of approaches to this problem.

Original language	English (US)
Article number	8423530
Pages (from-to)	41-67
Number of pages	27
Journal	IEEE Intelligent Systems
Volume	33
Issue number	3
DOIs	https://doi.org/10.1109/MIS.2018.033001416
State	Published - May 1 2018

Keywords

deep models
face recognition
QUIS-CAMPI
surveillance

ASJC Scopus subject areas

Computer Networks and Communications
Artificial Intelligence

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10.1109/MIS.2018.033001416

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Proenca, H., Nixon, M., Nappi, M., Ghaleb, E., Ozbulak, G., Gao, H., Ekenel, H. K., Grm, K., Struc, V., Shi, H., Zhu, X., Liao, S., Lei, Z., Li, S. Z., Gutfeter, W., Pacut, A., Brogan, J., Scheirer, W. J., Gonzalez-Sosa, E., ... De Maio, L. (2018). Trends and Controversies. IEEE Intelligent Systems, 33(3), 41-67. Article 8423530. https://doi.org/10.1109/MIS.2018.033001416

Proenca, H, Nixon, M, Nappi, M, Ghaleb, E, Ozbulak, G, Gao, H, Ekenel, HK, Grm, K, Struc, V, Shi, H, Zhu, X, Liao, S, Lei, Z, Li, SZ, Gutfeter, W, Pacut, A, Brogan, J, Scheirer, WJ, Gonzalez-Sosa, E, Vera-Rodriguez, R, Fierrez, J, Ortega-Garcia, J, Riccio, D & De Maio, L 2018, 'Trends and Controversies', IEEE Intelligent Systems, vol. 33, no. 3, 8423530, pp. 41-67. https://doi.org/10.1109/MIS.2018.033001416

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Trends and Controversies

Abstract

Keywords

ASJC Scopus subject areas

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