Two Methods for the Measurement of Substrate Dielectric Constant

Nirod K. Das; Susanne M. Voda; David M. Pozar

doi:10.1109/TMTT.1987.1133722

Two Methods for the Measurement of Substrate Dielectric Constant

Nirod K. Das, Susanne M. Voda, David M. Pozar

Electrical and Computer Engineering

Research output: Contribution to journal › Comment/debate › peer-review

Abstract

Two methods for the accurate and convenient measurement of the dielectric constant of a microwave substrate are proposed. Both methods use the precision measurement capability of the HP-8510 Network Analyzer system and a rigorous theoretical analysis of multilayer transmission lines [6], and hence can also be used for the measurement of the frequency dependence of the relative dielectric constant. Accuracy on the order of 1.0 percent can be obtained by use of these techniques. Measurements were done for various substrates and gave results as predicted.

Original language	English (US)
Pages (from-to)	636-642
Number of pages	7
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	35
Issue number	7
DOIs	https://doi.org/10.1109/TMTT.1987.1133722
State	Published - Jul 1987

ASJC Scopus subject areas

Radiation
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/TMTT.1987.1133722

Cite this

@article{344610a366e24721b51dfc982f407ad9,

title = "Two Methods for the Measurement of Substrate Dielectric Constant",

abstract = "Two methods for the accurate and convenient measurement of the dielectric constant of a microwave substrate are proposed. Both methods use the precision measurement capability of the HP-8510 Network Analyzer system and a rigorous theoretical analysis of multilayer transmission lines [6], and hence can also be used for the measurement of the frequency dependence of the relative dielectric constant. Accuracy on the order of 1.0 percent can be obtained by use of these techniques. Measurements were done for various substrates and gave results as predicted.",

author = "Das, {Nirod K.} and Voda, {Susanne M.} and Pozar, {David M.}",

year = "1987",

month = jul,

doi = "10.1109/TMTT.1987.1133722",

language = "English (US)",

volume = "35",

pages = "636--642",

journal = "IEEE Transactions on Microwave Theory and Techniques",

issn = "0018-9480",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "7",

}

TY - JOUR

T1 - Two Methods for the Measurement of Substrate Dielectric Constant

AU - Das, Nirod K.

AU - Voda, Susanne M.

AU - Pozar, David M.

PY - 1987/7

Y1 - 1987/7

N2 - Two methods for the accurate and convenient measurement of the dielectric constant of a microwave substrate are proposed. Both methods use the precision measurement capability of the HP-8510 Network Analyzer system and a rigorous theoretical analysis of multilayer transmission lines [6], and hence can also be used for the measurement of the frequency dependence of the relative dielectric constant. Accuracy on the order of 1.0 percent can be obtained by use of these techniques. Measurements were done for various substrates and gave results as predicted.

AB - Two methods for the accurate and convenient measurement of the dielectric constant of a microwave substrate are proposed. Both methods use the precision measurement capability of the HP-8510 Network Analyzer system and a rigorous theoretical analysis of multilayer transmission lines [6], and hence can also be used for the measurement of the frequency dependence of the relative dielectric constant. Accuracy on the order of 1.0 percent can be obtained by use of these techniques. Measurements were done for various substrates and gave results as predicted.

UR - http://www.scopus.com/inward/record.url?scp=0023381833&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023381833&partnerID=8YFLogxK

U2 - 10.1109/TMTT.1987.1133722

DO - 10.1109/TMTT.1987.1133722

M3 - Comment/debate

AN - SCOPUS:0023381833

SN - 0018-9480

VL - 35

SP - 636

EP - 642

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

IS - 7

ER -

Two Methods for the Measurement of Substrate Dielectric Constant

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this