Unusual surface and edge morphologies, sp2 to sp3 hybridized transformation and electronic damage after Ar+ ion irradiation of few-layer graphene surfaces

Salim Hamood Al-Harthi, Mohammed Elzain, Muataz Al-Barwani, Amal Kora'a, Thomas Hysen, Myo Tay Zar Myint, Maliemadom Ramaswamy Anantharaman

Research output: Contribution to journalArticlepeer-review

Abstract

Roughness and defects induced on few-layer graphene (FLG) irradiated by Ar+ ions at different energies were investigated using X-ray photoemission spectroscopy (XPS) and atomic force microscopy techniques. The results provide direct experimental evidence of ripple formation, sp2 to sp3 hybridized carbon transformation, electronic damage, Ar+ implantation, unusual defects and edge reconstructions in FLG, which depend on the irradiation energy. In addition, shadowing effects similar to those found in oblique-angle growth of thin films were seen. Reliable quantification of the transition from the sp2-bonding to sp3-hybridized state as a result of Ar+ ion irradiation is achieved from the deconvolution of the XPS C (1s) peak. Although the ion irradiation effect is demonstrated through the shape of the derivative of the Auger transition C KVV spectra, we show that the D parameter values obtained from these spectra which are normally used in the literature fail to account for the sp2 to sp3 hybridization transition. In contrast to what is known, it is revealed that using ion irradiation at large FLG sample tilt angles can lead to edge reconstructions. Furthermore, FLG irradiation by low energy of 0.25 keV can be a plausible way of peeling graphene layers without the need of Joule heating reported previously.

Original languageEnglish (US)
Article number466
JournalNanoscale Research Letters
Volume7
DOIs
StatePublished - 2012

Keywords

  • Argon sputtering
  • Edge reconstructions
  • Electronic damage
  • Few layer graphene

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

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