Variability and Reliability Awareness in the Age of Dark Silicon

Florian Kriebel; Muhammad Shafique; Semeen Rehman; Jorg Henkel; Siddharth Garg

doi:10.1109/MDAT.2015.2439640

Variability and Reliability Awareness in the Age of Dark Silicon

Florian Kriebel, Muhammad Shafique, Semeen Rehman, Jorg Henkel, Siddharth Garg

Research output: Contribution to journal › Article › peer-review

Abstract

Ability to supply more transistors per chip is outpacing improvements in cooling and power delivery. The result is operation that selectively powers on or off subsets of transistors. This paper suggests innovate ways to take advantage of the consequent dark silicon to meet a pair of additional emerging challenges-reliability and tolerance of variability.

Original language	English (US)
Article number	7115064
Pages (from-to)	59-67
Number of pages	9
Journal	IEEE Design and Test
Volume	33
Issue number	2
DOIs	https://doi.org/10.1109/MDAT.2015.2439640
State	Published - Apr 2016

Keywords

Dark Silicon
Fault Tolerance
Heterogeneous Computing
Multi-Cores
Power Density
Process Variations
Reliability
Soft Errors

ASJC Scopus subject areas

Software
Hardware and Architecture
Electrical and Electronic Engineering

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10.1109/MDAT.2015.2439640

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title = "Variability and Reliability Awareness in the Age of Dark Silicon",

abstract = "Ability to supply more transistors per chip is outpacing improvements in cooling and power delivery. The result is operation that selectively powers on or off subsets of transistors. This paper suggests innovate ways to take advantage of the consequent dark silicon to meet a pair of additional emerging challenges-reliability and tolerance of variability.",

keywords = "Dark Silicon, Fault Tolerance, Heterogeneous Computing, Multi-Cores, Power Density, Process Variations, Reliability, Soft Errors",

author = "Florian Kriebel and Muhammad Shafique and Semeen Rehman and Jorg Henkel and Siddharth Garg",

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AU - Garg, Siddharth

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KW - Power Density

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KW - Reliability

KW - Soft Errors

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Variability and Reliability Awareness in the Age of Dark Silicon

Abstract

Keywords

ASJC Scopus subject areas

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