VERMEER: A Tool for Tracing and Explaining Faulty C Programs

Daniel Schwartz-Narbonne; Chanseok Oh; Martin Schaf; Thomas Wies

doi:10.1109/ICSE.2015.236

VERMEER: A Tool for Tracing and Explaining Faulty C Programs

Daniel Schwartz-Narbonne, Chanseok Oh, Martin Schaf, Thomas Wies

Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present VERMEER, a new automated debugging tool for C. VERMEER combines two functionalities: (1) a dynamic tracer that produces a linearized trace from a faulty C program and a given test input; and (2) a static analyzer that explains why the trace fails. The tool works in phases that simplify the input program to a linear trace, which is then analyzed using an automated theorem prover to produce the explanation. The output of each phase is a valid C program. VERMEER is able to produce useful explanations of non trivial traces for real C programs within a few seconds. The tool demo can be found at http://youtu.be/E5lKHNJVerU.

Original language	English (US)
Title of host publication	Proceedings - 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering, ICSE 2015
Publisher	IEEE Computer Society
Pages	737-740
Number of pages	4
ISBN (Electronic)	9781479919345
DOIs	https://doi.org/10.1109/ICSE.2015.236
State	Published - Aug 12 2015
Event	37th IEEE/ACM International Conference on Software Engineering, ICSE 2015 - Florence, Italy Duration: May 16 2015 → May 24 2015

Publication series

Name	Proceedings - International Conference on Software Engineering
Volume	2
ISSN (Print)	0270-5257

Other

Other	37th IEEE/ACM International Conference on Software Engineering, ICSE 2015
Country/Territory	Italy
City	Florence
Period	5/16/15 → 5/24/15

ASJC Scopus subject areas

Software

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10.1109/ICSE.2015.236

Cite this

Schwartz-Narbonne, D., Oh, C., Schaf, M., & Wies, T. (2015). VERMEER: A Tool for Tracing and Explaining Faulty C Programs. In Proceedings - 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering, ICSE 2015 (pp. 737-740). Article 7203056 (Proceedings - International Conference on Software Engineering; Vol. 2). IEEE Computer Society. https://doi.org/10.1109/ICSE.2015.236

VERMEER: A Tool for Tracing and Explaining Faulty C Programs. / Schwartz-Narbonne, Daniel; Oh, Chanseok; Schaf, Martin et al.
Proceedings - 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering, ICSE 2015. IEEE Computer Society, 2015. p. 737-740 7203056 (Proceedings - International Conference on Software Engineering; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Schwartz-Narbonne, D, Oh, C, Schaf, M & Wies, T 2015, VERMEER: A Tool for Tracing and Explaining Faulty C Programs. in Proceedings - 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering, ICSE 2015., 7203056, Proceedings - International Conference on Software Engineering, vol. 2, IEEE Computer Society, pp. 737-740, 37th IEEE/ACM International Conference on Software Engineering, ICSE 2015, Florence, Italy, 5/16/15. https://doi.org/10.1109/ICSE.2015.236

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VERMEER: A Tool for Tracing and Explaining Faulty C Programs

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