Versatile BIST: An integrated approach to on-line/off-line BIST

Ramesh Karri, Nilanjan Mukherjee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper we report a versatile BIST approach (VBIST) that targets both off-line and on-line self test. VBIST uses off-line BIST circuitry for on-line testing as well. Unlike traditional on-line self test approaches, VBIST does not use functional data as test inputs. Rather, VBIST generates test patterns and compacts test responses during the normal mode of operation. Furthermore, VBIST coordinates this generation and application of test patterns and compaction of test responses with the usage profile of the modules in the design. VBIST entails little additional impact on performance and area of the design (vis-a-vis the performance and area of a design with off-line BIST). We validated the VBIST approach using the Synopsis Behavioral Compiler as the synthesis framework and by writing synthesis scripts for incorporating VBIST constraints.

Original languageEnglish (US)
Title of host publicationIEEE International Test Conference (TC)
Editors Anon
PublisherIEEE
Pages910-917
Number of pages8
StatePublished - 1998
EventProceedings of the 1998 IEEE International Test Conference - Washington, DC, USA
Duration: Oct 18 1998Oct 21 1998

Other

OtherProceedings of the 1998 IEEE International Test Conference
CityWashington, DC, USA
Period10/18/9810/21/98

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Karri, R., & Mukherjee, N. (1998). Versatile BIST: An integrated approach to on-line/off-line BIST. In Anon (Ed.), IEEE International Test Conference (TC) (pp. 910-917). IEEE.