VLSI Test and Trust Roundtable

Ramesh Karri; Janusz Rajski; Rob Aitken; Subhasish Mitra; Mark M. Tehranipoor

doi:10.1109/MDAT.2024.3444745

VLSI Test and Trust Roundtable

Ramesh Karri, Janusz Rajski, Rob Aitken, Subhasish Mitra, Mark M. Tehranipoor

Electrical and Computer Engineering

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Pages (from-to)	84-94
Number of pages	11
Journal	IEEE Design and Test
Volume	41
Issue number	6
DOIs	https://doi.org/10.1109/MDAT.2024.3444745
State	Published - 2024

ASJC Scopus subject areas

Software
Hardware and Architecture
Electrical and Electronic Engineering

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10.1109/MDAT.2024.3444745

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@article{c0765896c56b40e5b43ba079e24f156f,

title = "VLSI Test and Trust Roundtable",

author = "Ramesh Karri and Janusz Rajski and Rob Aitken and Subhasish Mitra and Tehranipoor, {Mark M.}",

year = "2024",

doi = "10.1109/MDAT.2024.3444745",

language = "English (US)",

volume = "41",

pages = "84--94",

journal = "IEEE Design and Test",

issn = "2168-2356",

publisher = "IEEE Computer Society",

number = "6",

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TY - JOUR

T1 - VLSI Test and Trust Roundtable

AU - Karri, Ramesh

AU - Rajski, Janusz

AU - Aitken, Rob

AU - Mitra, Subhasish

AU - Tehranipoor, Mark M.

PY - 2024

Y1 - 2024

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M3 - Comment/debate

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SN - 2168-2356

VL - 41

SP - 84

EP - 94

JO - IEEE Design and Test

JF - IEEE Design and Test

IS - 6

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VLSI Test and Trust Roundtable

ASJC Scopus subject areas

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