TY - JOUR
T1 - Whispering-gallery modes in a microsphere coated with a high-refractive index layer
T2 - Polarization-dependent sensitivity enhancement of the resonance-shift sensor and TE-TM resonance matching
AU - Teraoka, Iwao
AU - Arnold, Stephen
PY - 2007/3
Y1 - 2007/3
N2 - Sensitivity enhancement of a whispering-gallery-mode microsphere resonance-shift sensor by coating of a high-refractive index (RI) layer is examined for TM polarization. The enhancement of sensitivity in response to particle adsorption or a RI change of the surroundings at the optimized layer thickness is greater for the TM mode compared with the TE mode, but the TM mode requires a thicker layer. A particular choice of the layer thickness allows the TE and TM shifts to match. Matching of the resonance frequency of the two modes is also examined.
AB - Sensitivity enhancement of a whispering-gallery-mode microsphere resonance-shift sensor by coating of a high-refractive index (RI) layer is examined for TM polarization. The enhancement of sensitivity in response to particle adsorption or a RI change of the surroundings at the optimized layer thickness is greater for the TM mode compared with the TE mode, but the TM mode requires a thicker layer. A particular choice of the layer thickness allows the TE and TM shifts to match. Matching of the resonance frequency of the two modes is also examined.
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U2 - 10.1364/JOSAB.24.000653
DO - 10.1364/JOSAB.24.000653
M3 - Article
AN - SCOPUS:34047143225
SN - 0740-3224
VL - 24
SP - 653
EP - 659
JO - Journal of the Optical Society of America B: Optical Physics
JF - Journal of the Optical Society of America B: Optical Physics
IS - 3
ER -