Abstract
We describe a compact scanning tunneling microscope using piezoelectric bimorph elements to achieve a large scanning area of 20 μm2 at 4.2 K. This instrument provides inherent temperature compensation, compatibility with a high magnetic field environment, and a novel means of rough sample-tip (z) adjustment.
Original language | English (US) |
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Pages (from-to) | 735-738 |
Number of pages | 4 |
Journal | Review of Scientific Instruments |
Volume | 60 |
Issue number | 4 |
DOIs | |
State | Published - 1989 |
ASJC Scopus subject areas
- Instrumentation