X-alignment techniques for improving the observability of response compactors

Keyphrases

• Compactor 100%
• Alignment Method 100%
• Test Pattern 50%
• Scan Chain 50%
• Compaction 50%
• Test Quality 50%
• Scan Cell 50%
• Number of Scans 50%
• Two Dimensional 25%
• Hardware Implementation 25%
• Response Compaction 25%
• Efficient Heuristics 25%
• Control Delay 25%
• Test Response 25%
• Control Information 25%
• Integrated Circuit Testing 25%
• Multi-slice 25%
• SAT Problem 25%
• MaxSAT 25%
• Scan Slice 25%

Engineering

• Observability 100%
• Compactor 100%
• Two Dimensional 25%
• Integrated Circuit Testing 25%

Material Science

• Electronic Circuit 100%