| Original language | English (US) |
|---|---|
| Title of host publication | Characterization of organic thin films |
| Editors | A Ulman |
| Place of Publication | Boston |
| Publisher | Butterworth-Heinemann Press |
| State | Published - 1995 |
X-ray photoelectron spectroscopy of organic thin films
Abraham Ulman, James F. Elman
Research output: Chapter in Book/Report/Conference proceeding › Chapter (peer-reviewed) › peer-review