X-ray photoelectron spectroscopy of partial and stamped thiol-based self-assembled monolayers

X-ray photoelectron spectroscopy was used to explore the local environment of a perfluorinated thiol derivative incorporated into an alkanethiol matrix. The alkanethiol octadecylmercaptan (ODT) was formed via a printing procedure and samples taken at various stages of stamp depletion were investigated. Compared with the spectra obtained from a monolayer of the perfluorinated material adsorbed directly from solution, one can see distinct differences in the shape of the F 1s peak. We present possible interpretations of this behaviour from a molecular perspective.