X-ray photoelectron spectroscopy of partial and stamped thiol-based self-assembled monolayers

S. D. Evans, S. D. Cooper, S. R. Johnson, T. M. Flynn, A. Ulman

Research output: Contribution to journalArticlepeer-review

Abstract

X-ray photoelectron spectroscopy was used to explore the local environment of a perfluorinated thiol derivative incorporated into an alkanethiol matrix. The alkanethiol octadecylmercaptan (ODT) was formed via a printing procedure and samples taken at various stages of stamp depletion were investigated. Compared with the spectra obtained from a monolayer of the perfluorinated material adsorbed directly from solution, one can see distinct differences in the shape of the F 1s peak. We present possible interpretations of this behaviour from a molecular perspective.

Original languageEnglish (US)
Pages (from-to)247-253
Number of pages7
JournalSupramolecular Science
Volume4
Issue number3-4
DOIs
StatePublished - 1997

ASJC Scopus subject areas

  • Engineering(all)

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