XPS imaging of patterned self-assembled monolayers containing perfluorinated alkyl chains

S. D. Evans, T. M. Flyon, A. Ulman, G. Beamson

Research output: Contribution to journalArticle

Abstract

X-ray photoelectron spectroscopy (E-X) imaging has been applied to the study of perfluorinated self-assembled monolayers (SAM) adsorbed on gold surfaces. Patterned monolayers were formed using a 'stamping' procedure which enabled the formation of 'two-component' monolayers. The E-X images yield spatial information, with a 30 μm resolution, on the quality and chemical composition of the resulting monolayer structures.

Original languageEnglish (US)
Pages (from-to)187-192
Number of pages6
JournalSurface and Interface Analysis
Volume24
Issue number3
DOIs
StatePublished - Mar 1996

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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